Date of Award
2010
Document Type
Thesis
Degree Name
Bachelors
Department
Natural Sciences
First Advisor
Sendova, Mariana
Keywords
Physics, Thin Film, Refractive Index
Area of Concentration
Physics
Abstract
A method for measuring the thickness and refractive index of a transparent thin film by analyzing the reflectance spectra is developed. An overview of spin coating is presented, followed by a method for measuring film thickness by atomic force microscopy. The theory for finding the thickness or the refractive index of a film and refractive index of the substrate is developed, followed by experimental results for polystyrene thin films on glass substrates.
Recommended Citation
Hammer, Andrew, "Thickness and Refractive Index Measurements of Transparent Thin Films" (2010). Theses & ETDs. 4275.
https://digitalcommons.ncf.edu/theses_etds/4275